Show simple item record

dc.contributor.authorAlves Pereira, Luis Filipe
dc.contributor.authorDe Beenhouwer, Jan
dc.contributor.authorKastner, Johann
dc.contributor.authorSijbers, Jan
dc.date.accessioned2022-01-10T11:51:04Z
dc.date.available2021-11-02T16:01:40Z
dc.date.available2022-01-10T11:51:04Z
dc.date.issued2020
dc.identifier.issn1082-3409
dc.identifier.otherWOS:000649734800089
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37921.2
dc.sourceWOS
dc.titleExtreme Sparse X-ray Computed Laminography Via Convolutional Neural Networks
dc.typeProceedings paper
dc.contributor.imecauthorde Beenhouwer, Jan
dc.contributor.imecauthorSijbers, Jan
dc.contributor.imecauthorAlves Pereira, Luis Filipe
dc.contributor.imecauthorDe Beenhouwer, Jan
dc.contributor.orcidextKastner, Johann::0000-0002-3163-0916
dc.contributor.orcidimecDe Beenhouwer, Jan::0000-0001-5253-1274
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.identifier.doi10.1109/ICTAI50040.2020.00099
dc.identifier.eisbn978-1-7281-9228-4
dc.source.numberofpages5
dc.source.peerreviewyes
dc.source.beginpage612
dc.source.endpage616
dc.source.conference32nd IEEE International Conference on Tools with Artificial Intelligence (ICTAI)
dc.source.conferencedateNOV 09-11, 2020
dc.source.conferencelocationVirtual
dc.source.journalna
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record

VersionItemDateSummary

*Selected version