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Degradation Mechanism of Short Channel p-FinFETs under Hot Carrier Stress and Constant Voltage Stress
dc.contributor.author | Chang, Hao | |
dc.contributor.author | Zhou, Longda | |
dc.contributor.author | Yang, Hong | |
dc.contributor.author | Ji, Zhigang | |
dc.contributor.author | Liu, Qianqian | |
dc.contributor.author | Xu, Hao | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Yin, Huaxiang | |
dc.contributor.author | Wang, Wenwu | |
dc.date.accessioned | 2021-11-02T16:02:29Z | |
dc.date.available | 2021-11-02T16:02:29Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 1946-1550 | |
dc.identifier.other | WOS:000635636600049 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37991 | |
dc.source | WOS | |
dc.title | Degradation Mechanism of Short Channel p-FinFETs under Hot Carrier Stress and Constant Voltage Stress | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.identifier.eisbn | ***************** | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) | |
dc.source.conferencedate | JUL 20-23, 2020 | |
dc.source.conferencelocation | Singapore | |
imec.availability | Under review |
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