dc.contributor.author | Shlyakhov, Ilya | |
dc.contributor.author | Iakoubovskii, K. | |
dc.contributor.author | Banerjee, Sreetama | |
dc.contributor.author | Gaur, Abhinav | |
dc.contributor.author | Lin, Dennis | |
dc.contributor.author | Asselberghs, Inge | |
dc.contributor.author | Radu, Iuliana | |
dc.contributor.author | Chai, J. | |
dc.contributor.author | Yang, M. | |
dc.contributor.author | Wang, S. J. | |
dc.contributor.author | Houssa, Michel | |
dc.contributor.author | Stesmans, A. | |
dc.contributor.author | Afanas'ev, V. | |
dc.date.accessioned | 2021-12-08T11:31:21Z | |
dc.date.available | 2021-11-02T16:02:40Z | |
dc.date.available | 2021-12-08T11:31:21Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 0021-8979 | |
dc.identifier.other | WOS:000640620700002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37997.2 | |
dc.source | WOS | |
dc.title | Measurement of direct and indirect bandgaps in synthetic ultrathin MoS2 and WS2 films from photoconductivity spectra | |
dc.type | Journal article | |
dc.contributor.imecauthor | Shlyakhov, Ilya | |
dc.contributor.imecauthor | Gaur, Abhinav | |
dc.contributor.imecauthor | Lin, Dennis | |
dc.contributor.imecauthor | Asselberghs, Inge | |
dc.contributor.imecauthor | Radu, Iuliana | |
dc.contributor.imecauthor | Houssa, Michel | |
dc.contributor.orcidext | Shlyakhov, I.::0000-0003-0845-910X | |
dc.contributor.orcidimec | Radu, Iuliana::0000-0002-7230-7218 | |
dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
dc.identifier.doi | 10.1063/5.0046305 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 155302 | |
dc.source.journal | JOURNAL OF APPLIED PHYSICS | |
dc.source.issue | 15 | |
dc.source.volume | 129 | |
imec.availability | Published - imec | |