dc.contributor.author | Oudebrouckx, Gilles | |
dc.contributor.author | Wagner, Patrick Hermann | |
dc.contributor.author | Vandenryt, Thys | |
dc.contributor.author | Bormans, Seppe | |
dc.contributor.author | Thoelen, Ronald | |
dc.date.accessioned | 2022-06-10T09:19:36Z | |
dc.date.available | 2021-11-02T16:02:41Z | |
dc.date.available | 2022-06-10T09:19:36Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 1530-437X | |
dc.identifier.other | WOS:000636053600018 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37999.2 | |
dc.source | WOS | |
dc.title | Measuring Thermal Conductivity in a Microfluidic Device With the Transient Thermal Offset (TTO) Method | |
dc.type | Journal article | |
dc.contributor.imecauthor | Oudebrouckx, Gilles | |
dc.contributor.imecauthor | Vandenryt, Thys | |
dc.contributor.imecauthor | Bormans, Seppe | |
dc.contributor.imecauthor | Thoelen, Ronald | |
dc.contributor.orcidext | Wagner, Patrick Hermann::0000-0002-4028-3629 | |
dc.contributor.orcidimec | Oudebrouckx, Gilles::0000-0001-6278-3547 | |
dc.contributor.orcidimec | Thoelen, Ronald::0000-0001-6845-0866 | |
dc.identifier.doi | 10.1109/JSEN.2020.3047475 | |
dc.source.numberofpages | 10 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 7298 | |
dc.source.endpage | 7307 | |
dc.source.journal | IEEE SENSORS JOURNAL | |
dc.source.issue | 6 | |
dc.source.volume | 21 | |
imec.availability | Published - imec | |