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dc.contributor.authorOudebrouckx, Gilles
dc.contributor.authorVandenryt, Thijs
dc.contributor.authorBormans, Seppe
dc.contributor.authorWagner, Patrick Hermann
dc.contributor.authorThoelen, Ronald
dc.date.accessioned2021-11-02T16:02:41Z
dc.date.available2021-11-02T16:02:41Z
dc.date.issued2021-MAR 15
dc.identifier.issn1530-437X
dc.identifier.otherWOS:000636053600018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37999
dc.sourceWOS
dc.titleMeasuring Thermal Conductivity in a Microfluidic Device With the Transient Thermal Offset (TTO) Method
dc.typeJournal article
dc.contributor.imecauthorOudebrouckx, Gilles
dc.contributor.imecauthorVandenryt, Thijs
dc.contributor.imecauthorBormans, Seppe
dc.contributor.imecauthorThoelen, Ronald
dc.contributor.orcidextWagner, Patrick Hermann::0000-0002-4028-3629
dc.contributor.orcidimecOudebrouckx, Gilles::0000-0001-6278-3547
dc.contributor.orcidimecThoelen, Ronald::0000-0001-6845-0866
dc.identifier.doi10.1109/JSEN.2020.3047475
dc.source.numberofpages10
dc.source.peerreviewyes
dc.source.beginpage7298
dc.source.endpage7307
dc.source.journalIEEE SENSORS JOURNAL
dc.source.issue6
dc.source.volume21
imec.availabilityUnder review


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