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Analysis of the Influence of Roughness on the Propagation Constant of a Waveguide via Two Sparse Stochastic Methods

dc.contributor.authorWaeytens, Ruben
dc.contributor.authorBosman, Dries
dc.contributor.authorHuynen, Martijn
dc.contributor.authorGossye, Michiel
dc.contributor.authorRogier, Hendrik
dc.contributor.authorVande Ginste, Dries
dc.date.accessioned2022-01-06T11:07:56Z
dc.date.available2021-11-02T16:03:10Z
dc.date.available2022-01-06T11:07:56Z
dc.date.issued2020
dc.identifier.issn2165-4107
dc.identifier.otherWOS:000631247900001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38029.2
dc.sourceWOS
dc.titleAnalysis of the Influence of Roughness on the Propagation Constant of a Waveguide via Two Sparse Stochastic Methods
dc.typeProceedings paper
dc.contributor.imecauthorWaeytens, Ruben
dc.contributor.imecauthorBosman, Dries
dc.contributor.imecauthorHuynen, Martijn
dc.contributor.imecauthorGossye, Michiel
dc.contributor.imecauthorRogier, Hendrik
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.orcidimecRogier, Hendrik::0000-0001-8139-2736
dc.contributor.orcidimecBosman, Dries::0000-0002-0737-1678
dc.contributor.orcidimecHuynen, Martijn::0000-0002-5168-9421
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.identifier.eisbn978-1-7281-6161-7
dc.source.numberofpages3
dc.source.peerreviewyes
dc.source.conferenceIEEE 29th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)
dc.source.conferencedateOCT 05-07, 2020
dc.source.conferencelocationSan Jose, CA, USA
dc.source.journalna
imec.availabilityPublished - imec


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220.500.12860/38029.2*2022-01-06T11:06:41Zvalidation by library/open access desk
120.500.12860/380292021-11-02T16:03:10Z

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