A Machine Learning-Based Epistemic Modeling Framework for EMC and SI Assessment

dc.contributor.author	Kan, Duygu
dc.contributor.author	De Ridder, Simon
dc.contributor.author	Spina, Domenico
dc.contributor.author	Dhaene, Tom
dc.contributor.author	Rogier, Hendrik
dc.contributor.author	Vande Ginste, Dries
dc.contributor.author	Grassi, Flavia
dc.date.accessioned	2022-01-05T10:24:59Z
dc.date.available	2021-11-02T16:03:22Z
dc.date.available	2022-01-05T10:24:59Z
dc.date.issued	2020
dc.identifier.issn	2475-9481
dc.identifier.other	WOS:000628989600009
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/38051.2
dc.source	WOS
dc.title	A Machine Learning-Based Epistemic Modeling Framework for EMC and SI Assessment
dc.type	Proceedings paper
dc.contributor.imecauthor	Kan, Duygu
dc.contributor.imecauthor	De Ridder, Simon
dc.contributor.imecauthor	Spina, Domenico
dc.contributor.imecauthor	Dhaene, Tom
dc.contributor.imecauthor	Rogier, Hendrik
dc.contributor.imecauthor	Vande Ginste, Dries
dc.contributor.orcidimec	Kan, Duygu::0000-0001-8789-9087
dc.contributor.orcidimec	Spina, Domenico::0000-0003-2379-5259
dc.contributor.orcidimec	Dhaene, Tom::0000-0003-2899-4636
dc.contributor.orcidimec	Rogier, Hendrik::0000-0001-8139-2736
dc.contributor.orcidimec	Vande Ginste, Dries::0000-0002-0178-288X
dc.identifier.eisbn	978-1-7281-4204-3
dc.source.numberofpages	4
dc.source.peerreview	yes
dc.source.conference	24th IEEE Workshop on Signal and Power Integrity (SPI)
dc.source.conferencedate	MAY 17-20, 2020
dc.source.conferencelocation	Cologne
dc.source.journal	na
imec.availability	Published - imec

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Version	Item	Date	Summary
2	20.500.12860/38051.2*	2022-01-05T10:21:35Z	validation by library/open access desk
1	20.500.12860/38051	2021-11-02T16:03:22Z