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dc.contributor.authorHong, Zhangjie
dc.contributor.authorChauhan, Vikas
dc.contributor.authorSchoenherr, Simon
dc.contributor.authorFloyd, Brian A.
dc.date.accessioned2022-03-03T15:18:51Z
dc.date.available2021-11-02T16:03:31Z
dc.date.available2022-03-03T15:18:51Z
dc.date.issued2021
dc.identifier.issn0018-9480
dc.identifier.otherWOS:000626557300037
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38061.2
dc.sourceWOS
dc.titleCode-Modulated Embedded Test and Calibration of Phased-Array Transceivers
dc.typeJournal article
dc.contributor.imecauthorChauhan, Vikas
dc.contributor.orcidextFloyd, Brian A.::0000-0002-1124-2764
dc.contributor.orcidimecChauhan, Vikas::0000-0003-0512-6916
dc.identifier.doi10.1109/TMTT.2020.3041022
dc.source.numberofpages14
dc.source.peerreviewyes
dc.source.beginpage1846
dc.source.endpage1859
dc.source.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
dc.source.issue3
dc.source.volume69
imec.availabilityPublished - imec


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