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Surround Gate Transistor With Epitaxially Grown Si Pillar and Simulation Study on Soft Error and Rowhammer Tolerance for DRAM
dc.contributor.author | Han, Jin-Woo | |
dc.contributor.author | Kim, Jungsik | |
dc.contributor.author | Beery, Dafna | |
dc.contributor.author | Bozdag, K. Deniz | |
dc.contributor.author | Cuevas, Peter | |
dc.contributor.author | Levi, Amitay | |
dc.contributor.author | Tain, Irwin | |
dc.contributor.author | Tran, Khai | |
dc.contributor.author | Walker, Andrew J. | |
dc.contributor.author | Palayam, Senthil Vadakupudhu | |
dc.contributor.author | Arreghini, Antonio | |
dc.contributor.author | Furnemont, Arnaud | |
dc.contributor.author | Meyyappan, M. | |
dc.date.accessioned | 2022-05-20T07:46:06Z | |
dc.date.available | 2021-11-02T16:04:30Z | |
dc.date.available | 2022-05-20T07:46:06Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.other | WOS:000612147300012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38144.3 | |
dc.source | WOS | |
dc.title | Surround Gate Transistor With Epitaxially Grown Si Pillar and Simulation Study on Soft Error and Rowhammer Tolerance for DRAM | |
dc.type | Journal article | |
dc.contributor.imecauthor | Palayam, Senthil Vadakupudhu | |
dc.contributor.imecauthor | Arreghini, Antonio | |
dc.contributor.imecauthor | Furnemont, Arnaud | |
dc.contributor.orcidext | Han, Jin-Woo::0000-0002-5118-1310 | |
dc.contributor.orcidext | Kim, Jungsik::0000-0001-7798-3381 | |
dc.contributor.orcidext | Walker, Andrew J.::0000-0001-7842-061X | |
dc.contributor.orcidimec | Palayam, Senthil Vadakupudhu::0000-0002-0855-3377 | |
dc.contributor.orcidimec | Arreghini, Antonio::0000-0002-7493-9681 | |
dc.contributor.orcidimec | Furnemont, Arnaud::0000-0002-6378-1030 | |
dc.identifier.doi | 10.1109/TED.2020.3045966 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 529 | |
dc.source.endpage | 534 | |
dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
dc.source.issue | 2 | |
dc.source.volume | 68 | |
imec.availability | Under review |
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