dc.contributor.author | Derakhshandeh, Jaber | |
dc.contributor.author | Capuz, Giovanni | |
dc.contributor.author | Cherman, Vladimir | |
dc.contributor.author | Inoue, Fumihiro | |
dc.contributor.author | De Preter, Inge | |
dc.contributor.author | Hou, Lin | |
dc.contributor.author | Bex, Pieter | |
dc.contributor.author | Gerets, Carine | |
dc.contributor.author | Duval, Fabrice | |
dc.contributor.author | Webers, Tomas | |
dc.contributor.author | Bertheau, Julien | |
dc.contributor.author | Van Huylenbroeck, Stefaan | |
dc.contributor.author | Phommahaxay, Alain | |
dc.contributor.author | Shafahian, Ehsan | |
dc.contributor.author | Van der Plas, Geert | |
dc.contributor.author | Beyne, Eric | |
dc.contributor.author | Miller, Andy | |
dc.contributor.author | Beyer, Gerald | |
dc.date.accessioned | 2021-12-14T09:06:41Z | |
dc.date.available | 2021-11-02T16:04:36Z | |
dc.date.available | 2021-12-14T09:06:41Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 0569-5503 | |
dc.identifier.other | WOS:000620983200091 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38152.2 | |
dc.source | WOS | |
dc.title | 10 and 7 mu m Pitch Thermo-compression Solder Joint, Using A Novel Solder Pillar And Metal Spacer Process | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Derakhshandeh, Jaber | |
dc.contributor.imecauthor | Capuz, Giovanni | |
dc.contributor.imecauthor | Cherman, Vladimir | |
dc.contributor.imecauthor | Inoue, Fumihiro | |
dc.contributor.imecauthor | De Preter, Inge | |
dc.contributor.imecauthor | Hou, Lin | |
dc.contributor.imecauthor | Bex, Pieter | |
dc.contributor.imecauthor | Gerets, Carine | |
dc.contributor.imecauthor | Duval, Fabrice | |
dc.contributor.imecauthor | Webers, Tomas | |
dc.contributor.imecauthor | Bertheau, Julien | |
dc.contributor.imecauthor | Van Huylenbroeck, Stefaan | |
dc.contributor.imecauthor | Phommahaxay, Alain | |
dc.contributor.imecauthor | Shafahian, Ehsan | |
dc.contributor.imecauthor | Van der Plas, Geert | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.imecauthor | Miller, Andy | |
dc.contributor.imecauthor | Beyer, Gerald | |
dc.contributor.orcidimec | Derakhshandeh, Jaber::0000-0003-2448-9165 | |
dc.contributor.orcidimec | Capuz, Giovanni::0000-0002-5263-4836 | |
dc.contributor.orcidimec | Bex, Pieter::0000-0003-0896-2514 | |
dc.contributor.orcidimec | Van Huylenbroeck, Stefaan::0000-0001-9978-3575 | |
dc.contributor.orcidimec | Van der Plas, Geert::0000-0002-4975-6672 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.identifier.doi | 10.1109/ECTC32862.2020.00102 | |
dc.identifier.eisbn | 978-1-7281-6180-8 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 617 | |
dc.source.endpage | 622 | |
dc.source.conference | 70th IEEE Electronic Components and Technology Conference (ECTC) | |
dc.source.conferencedate | JUN 03-30, 2020 | |
dc.source.conferencelocation | Orlando, FL, USA | |
dc.source.journal | na | |
imec.availability | Published - imec | |