| dc.contributor.author | Magnani, Alessandro | |
| dc.contributor.author | Cosnier, Thibault | |
| dc.contributor.author | Amirifar, Nooshin | |
| dc.contributor.author | Zhao, Ming | |
| dc.contributor.author | Li, Xiangdong | |
| dc.contributor.author | Geens, Karen | |
| dc.contributor.author | Decoutere, Stefaan | |
| dc.date.accessioned | 2022-01-27T11:29:17Z | |
| dc.date.available | 2021-11-02T16:04:47Z | |
| dc.date.available | 2022-01-27T11:29:17Z | |
| dc.date.issued | 2020 | |
| dc.identifier.issn | na | |
| dc.identifier.other | WOS:000618046600023 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38164.2 | |
| dc.source | WOS | |
| dc.title | Thermal resistance characterization of GaN power HEMTs on Si, SOI, and poly-AlN substrates | |
| dc.type | Proceedings paper | |
| dc.contributor.imecauthor | Magnani, Alessandro | |
| dc.contributor.imecauthor | Cosnier, Thibault | |
| dc.contributor.imecauthor | Amirifar, Nooshin | |
| dc.contributor.imecauthor | Zhao, Ming | |
| dc.contributor.imecauthor | Li, Xiangdong | |
| dc.contributor.imecauthor | Geens, Karen | |
| dc.contributor.imecauthor | Decoutere, Stefaan | |
| dc.contributor.orcidimec | Magnani, Alessandro::0000-0001-6719-7467 | |
| dc.contributor.orcidimec | Cosnier, Thibault::0000-0001-7991-7222 | |
| dc.contributor.orcidimec | Zhao, Ming::0000-0002-0856-851X | |
| dc.contributor.orcidimec | Geens, Karen::0000-0003-1815-3972 | |
| dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
| dc.identifier.eisbn | 978-1-7281-6049-8 | |
| dc.source.numberofpages | 6 | |
| dc.source.peerreview | yes | |
| dc.source.conference | 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) | |
| dc.source.conferencedate | JUL 05-08, 2020 | |
| dc.source.conferencelocation | Cracow | |
| dc.source.journal | na | |
| imec.availability | Published - imec | |
