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Fast & Accurate Methodology for Aging Incorporation in Circuits using Adaptive Waveform Splitting (AWS)

dc.contributor.authorMishra, Subrat
dc.contributor.authorWeckx, Pieter
dc.contributor.authorLin, Ji-Yung
dc.contributor.authorKaczer, Ben
dc.contributor.authorLinten, Dimitri
dc.contributor.authorSpessot, Alessio
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-11-25T10:19:32Z
dc.date.available2021-11-02T16:05:15Z
dc.date.available2021-11-25T10:19:32Z
dc.date.issued2020
dc.identifier.issn1541-7026
dc.identifier.otherWOS:000612717200148
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38199.3
dc.sourceWOS
dc.titleFast & Accurate Methodology for Aging Incorporation in Circuits using Adaptive Waveform Splitting (AWS)
dc.typeProceedings paper
dc.contributor.imecauthorMishra, Subrat
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorLin, J. Y.
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.identifier.eisbn978-1-7281-3199-3
dc.source.numberofpages5
dc.source.peerreviewyes
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateAPR 28-MAY 30, 2020
dc.source.conferencelocationDallas, TX, USA
dc.source.journalna
imec.availabilityPublished - imec


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