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Sweeping for Leakage in Masked Circuit Layouts
dc.contributor.author | Sijacic, Danilo | |
dc.contributor.author | Balasch, Josep | |
dc.contributor.author | Verbauwhede, Ingrid | |
dc.date.accessioned | 2021-11-17T09:57:52Z | |
dc.date.available | 2021-11-02T16:05:23Z | |
dc.date.available | 2021-11-17T09:57:52Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 1530-1591 | |
dc.identifier.other | WOS:000610549200167 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38207.2 | |
dc.source | WOS | |
dc.title | Sweeping for Leakage in Masked Circuit Layouts | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Sijacic, Danilo | |
dc.contributor.imecauthor | Balasch, Josep | |
dc.contributor.imecauthor | Verbauwhede, Ingrid | |
dc.contributor.orcidimec | Verbauwhede, Ingrid::0000-0002-0879-076X | |
dc.identifier.eisbn | 978-3-9819263-4-7 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 915 | |
dc.source.endpage | 920 | |
dc.source.conference | Design, Automation and Test in Europe Conference and Exhibition (DATE) | |
dc.source.conferencedate | MAR 09-13, 2020 | |
dc.source.conferencelocation | Grenoble | |
dc.source.journal | Design, Automation and Test in Europe Conference and Exhibition (DATE) | |
imec.availability | Published - imec |
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