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Relevance of fin dimensions and high-pressure anneals on hot-carrier degradation

dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorFranco, Jacopo
dc.contributor.authorBury, Erik
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorDentoni Litta, Eugenio
dc.contributor.authorSpessot, Alessio
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorLinten, Dimitri
dc.contributor.authorKaczer, Ben
dc.date.accessioned2022-01-20T11:28:13Z
dc.date.available2021-11-02T16:05:23Z
dc.date.available2022-01-20T11:22:36Z
dc.date.available2022-01-20T11:28:13Z
dc.date.issued2020
dc.identifier.issn1541-7026
dc.identifier.otherWOS:000612717200167
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38209.3
dc.sourceWOS
dc.titleRelevance of fin dimensions and high-pressure anneals on hot-carrier degradation
dc.typeProceedings paper
dc.contributor.imecauthorChasin, Adrian
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorLitta, Eugenio
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorBen Kaczer
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorDentoni Litta, Eugenio
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecDentoni Litta, Eugenio::0000-0003-0333-376X
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.identifier.eisbn978-1-7281-3199-3
dc.source.numberofpages6
dc.source.peerreviewyes
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateAPR 28-MAY 30, 2020
dc.source.conferencelocationDallas, TX, USA
dc.source.journalna
imec.availabilityPublished - imec


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320.500.12860/38209.3*2022-01-20T11:25:22Zvalidation by library/open access desk
220.500.12860/38209.22021-11-30T09:02:24Zvalidation by imec author
120.500.12860/382092021-11-02T16:05:23Z

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