dc.contributor.author | Maldonado, D. | |
dc.contributor.author | Roldan, J. B. | |
dc.contributor.author | Roldan, A. M. | |
dc.contributor.author | Jimenez-Molinos, F. | |
dc.contributor.author | Hui, F. | |
dc.contributor.author | Jing, Xu | |
dc.contributor.author | Wen, C. | |
dc.contributor.author | Lanza, M. | |
dc.contributor.author | Shi, Yuanyuan | |
dc.date.accessioned | 2021-11-24T09:12:09Z | |
dc.date.available | 2021-11-02T16:05:41Z | |
dc.date.available | 2021-11-24T09:12:09Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:000612717200028 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38226.2 | |
dc.source | WOS | |
dc.title | Influence of the magnetic field on dielectric breakdown in memristors based on h-BN stacks | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Shi, Y. | |
dc.contributor.imecauthor | Shi, Yuanyuan | |
dc.contributor.orcidimec | Shi, Yuanyuan::0000-0002-4836-6752 | |
dc.identifier.eisbn | 978-1-7281-3199-3 | |
dc.source.numberofpages | 5 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | APR 28-MAY 30, 2020 | |
dc.source.conferencelocation | Dallas, TX, USA | |
dc.source.journal | na | |
imec.availability | Published - imec | |