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On the impact of the capture rates on the generation/recombination lifetime ratio of a single deep level

dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-14T11:38:57Z
dc.date.available2021-10-14T11:38:57Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3825
dc.sourceIIOimport
dc.titleOn the impact of the capture rates on the generation/recombination lifetime ratio of a single deep level
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage1487
dc.source.endpage1488
dc.source.journalIEEE Trans. Electron Devices
dc.source.issue7
dc.source.volume46
imec.availabilityPublished - imec


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