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Reliability aspects of the low-frequency noise behaviour of submicron CMOS technologies

dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-14T11:39:01Z
dc.date.available2021-10-14T11:39:01Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3826
dc.sourceIIOimport
dc.titleReliability aspects of the low-frequency noise behaviour of submicron CMOS technologies
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpageR61
dc.source.endpageR71
dc.source.journalSemiconductor Science and Technology
dc.source.volume14
imec.availabilityPublished - open access


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