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3D-printed optical probes for wafer-level testing of photonic integrated circuits
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Authors
Trappen, Mareike
;
Blaicher, Matthias
;
Dietrich, Philipp-Immanuel
;
Dankwart, Colin
;
Xu, Yilin
;
Hoose, Tobias
;
Billah, Muhammad Rodlin
;
Abbasi, Amin
;
Baets, Roel
;
Troppenz, Ute
;
Theurer, Michael
;
Woerhoff, Kerstin
;
Seyfried, Moritz
;
Freude, Wolfgang
;
Koos, Christian
DOI
10.1364/OE.405139
ISSN
1094-4087
PMID
MEDLINE:33379622
Issue
25
Journal
OPTICS EXPRESS
Volume
28
Title
3D-printed optical probes for wafer-level testing of photonic integrated circuits
Publication type
Journal article
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2
20.500.12860/38277.2
*
2022-01-03T10:18:00Z
validation by library/open access desk
1
20.500.12860/38277
2021-11-02T16:06:29Z
*Selected version
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