dc.contributor.author | Jannis, D. | |
dc.contributor.author | Guzzinati, G. | |
dc.contributor.author | Beche, A. | |
dc.contributor.author | Verbeeck, J. | |
dc.contributor.author | Prabhakara, Viveksharma | |
dc.contributor.author | Bender, Hugo | |
dc.date.accessioned | 2021-12-02T13:17:39Z | |
dc.date.available | 2021-11-02T16:07:03Z | |
dc.date.available | 2021-12-02T13:17:39Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 0304-3991 | |
dc.identifier.other | WOS:000594768500006 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38334.2 | |
dc.source | WOS | |
dc.title | HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale | |
dc.type | Journal article | |
dc.contributor.imecauthor | Prabhakara, V | |
dc.contributor.imecauthor | Bender, H. | |
dc.contributor.imecauthor | Prabhakara, Viveksharma | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.orcidext | Verbeeck, J.::0000-0002-7151-8101 | |
dc.identifier.doi | 10.1016/j.ultramic.2020.113099 | |
dc.source.numberofpages | 10 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 113099 | |
dc.source.journal | ULTRAMICROSCOPY | |
dc.identifier.pmid | MEDLINE:32896758 | |
dc.source.issue | na | |
dc.source.volume | 219 | |
imec.availability | Published - imec | |