dc.contributor.author | Smets, Quentin | |
dc.contributor.author | Verreck, Devin | |
dc.contributor.author | Shi, Yuanyuan | |
dc.contributor.author | Arutchelvan, Goutham | |
dc.contributor.author | Groven, Benjamin | |
dc.contributor.author | Wu, Xiangyu | |
dc.contributor.author | Sutar, Surajit | |
dc.contributor.author | Banerjee, Sreetama | |
dc.contributor.author | Nalin Mehta, Ankit | |
dc.contributor.author | Lin, Dennis | |
dc.contributor.author | Asselberghs, Inge | |
dc.contributor.author | Radu, Iuliana | |
dc.date.accessioned | 2022-01-24T10:23:18Z | |
dc.date.available | 2021-12-06T02:06:18Z | |
dc.date.available | 2022-01-24T10:23:18Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 2380-9248 | |
dc.identifier.other | WOS:000717011600002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38544.2 | |
dc.source | WOS | |
dc.title | Sources of variability in scaled MoS2 FETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Smets, Quentin | |
dc.contributor.imecauthor | Verreck, Devin | |
dc.contributor.imecauthor | Groven, Benjamin | |
dc.contributor.imecauthor | Sutar, Surajit | |
dc.contributor.imecauthor | Banerjee, Sreetama | |
dc.contributor.imecauthor | Lin, Dennis | |
dc.contributor.imecauthor | Asselberghs, Inge | |
dc.contributor.imecauthor | Radu, Iuliana | |
dc.contributor.imecauthor | Shi, Yuanyuan | |
dc.contributor.imecauthor | Arutchelvan, Goutham | |
dc.contributor.imecauthor | Nalin Mehta, Ankit | |
dc.contributor.orcidimec | Smets, Quentin::0000-0002-2356-5915 | |
dc.contributor.orcidimec | Verreck, Devin::0000-0002-3833-5880 | |
dc.contributor.orcidimec | Groven, Benjamin::0000-0002-5781-7594 | |
dc.contributor.orcidimec | Radu, Iuliana::0000-0002-7230-7218 | |
dc.contributor.orcidimec | Shi, Yuanyuan::0000-0002-4836-6752 | |
dc.contributor.orcidimec | Nalin Mehta, Ankit::0000-0002-2169-940X | |
dc.identifier.doi | 10.1109/IEDM13553.2020.9371890 | |
dc.identifier.eisbn | 978-1-7281-8888-1 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Electron Devices Meeting (IEDM) | |
dc.source.conferencedate | DEC 12-18, 2020 | |
dc.source.conferencelocation | Virtual | |
dc.source.journal | na | |
imec.availability | Published - imec | |