dc.contributor.author | Santermans, Sybren | |
dc.contributor.author | Barge, David | |
dc.contributor.author | Hellings, Geert | |
dc.contributor.author | Bergfeld Mori, Carlos | |
dc.contributor.author | Migacz, Konrad Joseph | |
dc.contributor.author | Rip, Jens | |
dc.contributor.author | Spampinato, Valentina | |
dc.contributor.author | Vos, Rita | |
dc.contributor.author | Du Bois, Bert | |
dc.contributor.author | Ray Chaudhuri, Ashesh | |
dc.contributor.author | Martino, J. A. | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Severi, Simone | |
dc.contributor.author | Van Roy, Wim | |
dc.contributor.author | Martens, Koen | |
dc.date.accessioned | 2021-12-09T11:31:49Z | |
dc.date.available | 2021-12-06T02:06:36Z | |
dc.date.available | 2021-12-09T11:31:49Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 2380-9248 | |
dc.identifier.other | WOS:000717011600020 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38555.2 | |
dc.source | WOS | |
dc.title | 50 nm Gate Length FinFET Biosensor & the Outlook for Single-Molecule Detection | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Santermans, S. | |
dc.contributor.imecauthor | Barge, D. | |
dc.contributor.imecauthor | Migacz, K. J. | |
dc.contributor.imecauthor | Rip, J. | |
dc.contributor.imecauthor | Spampinato, V | |
dc.contributor.imecauthor | Vos, R. | |
dc.contributor.imecauthor | Du Bois, B. | |
dc.contributor.imecauthor | Chaudhuri, A. R. | |
dc.contributor.imecauthor | Heyns, M. | |
dc.contributor.imecauthor | Severi, S. | |
dc.contributor.imecauthor | Van Roy, W. | |
dc.contributor.imecauthor | Martens, K. | |
dc.contributor.imecauthor | Santermans, Sybren | |
dc.contributor.imecauthor | Barge, David | |
dc.contributor.imecauthor | Hellings, Geert | |
dc.contributor.imecauthor | Bergfeld Mori, Carlos | |
dc.contributor.imecauthor | Migacz, Konrad Joseph | |
dc.contributor.imecauthor | Rip, Jens | |
dc.contributor.imecauthor | Spampinato, Valentina | |
dc.contributor.imecauthor | Vos, Rita | |
dc.contributor.imecauthor | Du Bois, Bert | |
dc.contributor.imecauthor | Ray Chaudhuri, Ashesh | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | Severi, Simone | |
dc.contributor.imecauthor | Van Roy, Wim | |
dc.contributor.imecauthor | Martens, Koen | |
dc.contributor.orcidimec | Santermans, Sybren::0000-0002-0843-102X | |
dc.contributor.orcidimec | Barge, David::0000-0002-1251-504X | |
dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
dc.contributor.orcidimec | Spampinato, Valentina::0000-0003-3225-6740 | |
dc.contributor.orcidimec | Du Bois, Bert::0000-0003-0147-1296 | |
dc.contributor.orcidimec | Van Roy, Wim::0000-0003-3232-1987 | |
dc.contributor.orcidimec | Martens, Koen::0000-0001-7135-5536 | |
dc.identifier.doi | 10.1109/IEDM13553.2020.9371908 | |
dc.identifier.eisbn | 978-1-7281-8888-1 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Electron Devices Meeting (IEDM) | |
dc.source.conferencedate | DEC 12-18, 2020 | |
dc.source.conferencelocation | San Francisco, CA, USA | |
dc.source.journal | na | |
imec.availability | Published - imec | |