dc.contributor.author | You, Shuzhen | |
dc.contributor.author | Geens, Karen | |
dc.contributor.author | Borga, Matteo | |
dc.contributor.author | Liang, Hu | |
dc.contributor.author | Hahn, Herwig | |
dc.contributor.author | Fahle, Dirk | |
dc.contributor.author | Heuken, Michael | |
dc.contributor.author | Mukherjee, Kalparupa | |
dc.contributor.author | De Santi, Carlo | |
dc.contributor.author | Meneghini, Matteo | |
dc.contributor.author | Zanoni, Enrico | |
dc.contributor.author | Berg, Martin | |
dc.contributor.author | Ramvall, Peter | |
dc.contributor.author | Kumar, Ashutosh | |
dc.contributor.author | Bjork, Mikael T. | |
dc.contributor.author | Ohlsson, B. Jonas | |
dc.contributor.author | Decoutere, Stefaan | |
dc.date.accessioned | 2022-01-26T11:54:07Z | |
dc.date.available | 2022-01-08T02:05:06Z | |
dc.date.available | 2022-01-26T11:54:07Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 0026-2714 | |
dc.identifier.other | WOS:000733586300008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38725.2 | |
dc.source | WOS | |
dc.title | Vertical GaN devices: Process and reliability | |
dc.type | Journal article | |
dc.contributor.imecauthor | You, Shuzhen | |
dc.contributor.imecauthor | Geens, Karen | |
dc.contributor.imecauthor | Borga, Matteo | |
dc.contributor.imecauthor | Liang, Hu | |
dc.contributor.imecauthor | Decoutere, Stefaan | |
dc.contributor.orcidimec | Geens, Karen::0000-0003-1815-3972 | |
dc.contributor.orcidimec | Borga, Matteo::0000-0003-3087-6612 | |
dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
dc.identifier.doi | 10.1016/j.microrel.2021.114218 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.journal | MICROELECTRONICS RELIABILITY | |
dc.source.issue | na | |
dc.source.volume | 126 | |
imec.availability | Published - imec | |