Vertical GaN devices: Process and reliability

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dc.contributor.author	You, Shuzhen
dc.contributor.author	Geens, Karen
dc.contributor.author	Borga, Matteo
dc.contributor.author	Liang, Hu
dc.contributor.author	Hahn, Herwig
dc.contributor.author	Fahle, Dirk
dc.contributor.author	Heuken, Michael
dc.contributor.author	Mukherjee, Kalparupa
dc.contributor.author	De Santi, Carlo
dc.contributor.author	Meneghini, Matteo
dc.contributor.author	Zanoni, Enrico
dc.contributor.author	Berg, Martin
dc.contributor.author	Ramvall, Peter
dc.contributor.author	Kumar, Ashutosh
dc.contributor.author	Bjork, Mikael T.
dc.contributor.author	Ohlsson, B. Jonas
dc.contributor.author	Decoutere, Stefaan
dc.date.accessioned	2022-01-08T02:05:06Z
dc.date.available	2022-01-08T02:05:06Z
dc.date.issued	2021-NOV
dc.identifier.issn	0026-2714
dc.identifier.other	WOS:000733586300008
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/38725
dc.source	WOS
dc.title	Vertical GaN devices: Process and reliability
dc.type	Journal article
dc.contributor.imecauthor	You, Shuzhen
dc.contributor.imecauthor	Geens, Karen
dc.contributor.imecauthor	Borga, Matteo
dc.contributor.imecauthor	Liang, Hu
dc.contributor.imecauthor	Decoutere, Stefaan
dc.contributor.orcidimec	Geens, Karen::0000-0003-1815-3972
dc.contributor.orcidimec	Borga, Matteo::0000-0003-3087-6612
dc.contributor.orcidimec	Decoutere, Stefaan::0000-0001-6632-6239
dc.identifier.doi	10.1016/j.microrel.2021.114218
dc.source.numberofpages	6
dc.source.peerreview	yes
dc.source.journal	MICROELECTRONICS RELIABILITY
dc.source.volume	126
imec.availability	Under review

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Version	Item	Date	Summary
2	20.500.12860/38725.2	2022-01-26T11:53:22Z	validation by library/open access desk
1	20.500.12860/38725*	2022-01-08T02:05:06Z