dc.contributor.author | Firat, Meric | |
dc.contributor.author | Payo, Maria Recaman | |
dc.contributor.author | Duerinckx, Filip | |
dc.contributor.author | Tous, Loic | |
dc.contributor.author | Poortmans, Jef | |
dc.contributor.author | Sivaramakrishnan Radhakrishnan, Hariharsudan | |
dc.date.accessioned | 2022-03-23T10:54:47Z | |
dc.date.available | 2022-02-15T10:15:05Z | |
dc.date.available | 2022-03-23T10:54:47Z | |
dc.date.issued | 2022-01-01 | |
dc.identifier.issn | 0038-092X | |
dc.identifier.other | WOS:000744236400008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38860.2 | |
dc.source | WOS | |
dc.title | In situ phosphorus-doped polycrystalline silicon films by low pressure chemical vapor deposition for contact passivation of silicon solar cells | |
dc.type | Journal article | |
dc.contributor.imecauthor | Firat, Meric | |
dc.contributor.imecauthor | Radhakrishnan, Hariharsudan Sivaramakrishnan | |
dc.contributor.imecauthor | Duerinckx, Filip | |
dc.contributor.imecauthor | Tous, Loic | |
dc.contributor.imecauthor | Poortmans, Jef | |
dc.contributor.imecauthor | Sivaramakrishnan Radhakrishnan, Hariharsudan | |
dc.contributor.orcidimec | Firat, Meric::0000-0002-6509-9668 | |
dc.contributor.orcidimec | Duerinckx, Filip::0000-0003-2570-7371 | |
dc.contributor.orcidimec | Tous, Loic::0000-0001-9928-7774 | |
dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
dc.contributor.orcidimec | Sivaramakrishnan Radhakrishnan, Hariharsudan::0000-0003-1963-273X | |
dc.identifier.doi | 10.1016/j.solener.2021.11.045 | |
dc.source.numberofpages | 10 | |
dc.source.peerreview | yes | |
dc.subject.discipline | Energy & fuels | |
dc.source.beginpage | 78 | |
dc.source.endpage | 87 | |
dc.source.journal | SOLAR ENERGY | |
dc.source.issue | January | |
dc.source.volume | 231 | |
imec.availability | Published - imec | |
dc.description.wosFundingText | The authors would like to acknowledge Rajiv Sharma from KU Leuven for his help with the interfacial oxide development, Sukhvinder Singh and Patrick Choulat from Imec for their help with the contact resistivity measurements and sample fabrication, Thomas Nuytten andStefanie Sergeant from Imec for the Raman spectroscopy measurements, Bastien Douhard and Mustafa Ayyad from Imec for SIMS measurements, Maxim Korytov, Laura Nelissen, and Patricia van Marcke from Imec for the TEM specimen preparation and measurements, and Janusz Bogda-nowicz from Imec for his help with the analysis of the Hall measurement data. This work was supported by the European Union's Horizon2020 Programme for research, technological development, and demonstra-tion [grant number 857793] ; and by the Kuwait for the Advancement of Sciences [grant number CN18-15EE-01] . | |