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Characterisation of epitaxial laterally overgrown Gallium Nitride using transmission electron microscopy

dc.contributor.authorTricker, D. M.
dc.contributor.authorJacobs, Koen
dc.contributor.authorHumphreys, C. J.
dc.date.accessioned2021-10-14T11:44:20Z
dc.date.available2021-10-14T11:44:20Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3893
dc.sourceIIOimport
dc.titleCharacterisation of epitaxial laterally overgrown Gallium Nitride using transmission electron microscopy
dc.typeJournal article
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage633
dc.source.endpage637
dc.source.journalPhysica Status Solidi B
dc.source.issue1
dc.source.volume216
imec.availabilityPublished - open access


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