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dc.contributor.authorDaneels, Glenn
dc.contributor.authorVan Leemput, Dries
dc.contributor.authorDelgado, Carmen
dc.contributor.authorDe Poorter, Eli
dc.contributor.authorLatre, Steven
dc.contributor.authorFamaey, Jeroen
dc.date.accessioned2022-02-22T13:56:01Z
dc.date.available2022-02-22T13:56:01Z
dc.date.issued2021
dc.identifier.issn1424-8220
dc.identifier.otherWOS:000682273500001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39017
dc.sourceWOS
dc.titleParent and PHY Selection in Slot Bonding IEEE 802.15.4e TSCH Networks
dc.typeJournal article
dc.contributor.imecauthorDaneels, Glenn
dc.contributor.imecauthorVan Leemput, Dries
dc.contributor.imecauthorDe Poorter, Eli
dc.contributor.imecauthorLatre, Steven
dc.contributor.imecauthorFamaey, Jeroen
dc.contributor.orcidimecDe Poorter, Eli::0000-0002-0214-5751
dc.contributor.orcidimecFamaey, Jeroen::0000-0002-3587-1354
dc.contributor.orcidimecVan Leemput, Dries::0000-0002-1910-8965
dc.identifier.doi10.3390/s21155150
dc.source.numberofpages21
dc.source.peerreviewyes
dc.source.beginpage5150
dc.source.journalSENSORS
dc.identifier.pmidMEDLINE:34372388
dc.source.issue15
dc.source.volume21
imec.availabilityPublished - open access


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