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dc.contributor.authorKeijsers, Noel L. W.
dc.contributor.authorBooth, Brian
dc.contributor.authorSijbers, Jan
dc.date.accessioned2022-02-23T10:00:40Z
dc.date.available2022-02-23T10:00:40Z
dc.date.issued2021
dc.identifier.issn1541-1672
dc.identifier.otherWOS:000672536900006
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39043
dc.sourceWOS
dc.titleOutlier Detection for Foot Complaint Diagnosis: Modeling Confounding Factors Using Metric Learning
dc.typeJournal article
dc.contributor.imecauthorBooth, Brian
dc.contributor.imecauthorSijbers, Jan
dc.contributor.orcidextBooth, Brian G.::0000-0001-9228-4810
dc.contributor.orcidextSijbers, Jan::0000-0003-4225-2487
dc.contributor.orcidimecBooth, Brian::0000-0001-9228-4810
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.identifier.doi10.1109/MIS.2020.3046431
dc.source.numberofpages9
dc.source.peerreviewyes
dc.source.beginpage41
dc.source.endpage49
dc.source.journalIEEE INTELLIGENT SYSTEMS
dc.source.issue3
dc.source.volume36
imec.availabilityPublished - open access


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