dc.contributor.author | Mareen, Hannes | |
dc.contributor.author | Van Kets, Niels | |
dc.contributor.author | Lambert, Peter | |
dc.contributor.author | Van Wallendael, Glenn | |
dc.date.accessioned | 2022-03-01T15:48:59Z | |
dc.date.available | 2022-03-01T15:48:59Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 2079-9292 | |
dc.identifier.other | WOS:000654954000001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39196 | |
dc.source | WOS | |
dc.title | Fast Fallback Watermark Detection Using Perceptual Hashes | |
dc.type | Journal article | |
dc.contributor.imecauthor | Mareen, Hannes | |
dc.contributor.imecauthor | Van Kets, Niels | |
dc.contributor.imecauthor | Lambert, Peter | |
dc.contributor.imecauthor | Van Wallendael, Glenn | |
dc.contributor.orcidimec | Van Kets, Niels::0000-0001-5495-2240 | |
dc.contributor.orcidimec | Van Wallendael, Glenn::0000-0001-9530-3466 | |
dc.contributor.orcidimec | Mareen, Hannes::0000-0002-0660-3190 | |
dc.contributor.orcidimec | Lambert, Peter::0000-0001-5313-4158 | |
dc.identifier.doi | 10.3390/electronics10101155 | |
dc.source.numberofpages | 18 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1155 | |
dc.source.journal | ELECTRONICS | |
dc.source.issue | 10 | |
dc.source.volume | 10 | |
imec.availability | Published - open access | |