dc.contributor.author | Steenwinckel, Bram | |
dc.contributor.author | De Paepe, Dieter | |
dc.contributor.author | Hautte, Sander Vanden | |
dc.contributor.author | Heyvaert, Pieter | |
dc.contributor.author | Bentefrit, Mohamed | |
dc.contributor.author | Moens, Pieter | |
dc.contributor.author | Dimou, Anastasia | |
dc.contributor.author | Van Den Bossche, Bruno | |
dc.contributor.author | De Turck, Filip | |
dc.contributor.author | Van Hoecke, Sofie | |
dc.contributor.author | Ongenae, Femke | |
dc.date.accessioned | 2022-03-02T08:46:40Z | |
dc.date.available | 2022-03-02T08:46:40Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 0167-739X | |
dc.identifier.other | WOS:000599846600006 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39203 | |
dc.source | WOS | |
dc.title | FLAGS: A methodology for adaptive anomaly detection and root cause analysis on sensor data streams by fusing expert knowledge with machine learning | |
dc.type | Journal article | |
dc.contributor.imecauthor | Steenwinckel, Bram | |
dc.contributor.imecauthor | De Paepe, Dieter | |
dc.contributor.imecauthor | Hautte, Sander Vanden | |
dc.contributor.imecauthor | Heyvaert, Pieter | |
dc.contributor.imecauthor | Moens, Pieter | |
dc.contributor.imecauthor | Dimou, Anastasia | |
dc.contributor.imecauthor | De Turck, Filip | |
dc.contributor.imecauthor | Van Hoecke, Sofie | |
dc.contributor.imecauthor | Ongenae, Femke | |
dc.contributor.orcidimec | Dimou, Anastasia::0000-0003-2138-7972 | |
dc.contributor.orcidimec | De Turck, Filip::0000-0003-4824-1199 | |
dc.contributor.orcidimec | Steenwinckel, Bram::0000-0002-3488-2334 | |
dc.contributor.orcidimec | Heyvaert, Pieter::0000-0002-1583-5719 | |
dc.contributor.orcidimec | Van Hoecke, Sofie::0000-0002-7865-6793 | |
dc.contributor.orcidimec | Ongenae, Femke::0000-0003-2529-5477 | |
dc.identifier.doi | 10.1016/j.future.2020.10.015 | |
dc.source.numberofpages | 19 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 30 | |
dc.source.endpage | 48 | |
dc.source.journal | FUTURE GENERATION COMPUTER SYSTEMS-THE INTERNATIONAL JOURNAL OF ESCIENCE | |
dc.source.issue | na | |
dc.source.volume | 116 | |
imec.availability | Published - open access | |