dc.contributor.author | Presenti, Alice | |
dc.contributor.author | Sijbers, Jan | |
dc.contributor.author | De Beenhouwer, Jan | |
dc.date.accessioned | 2022-03-02T13:06:55Z | |
dc.date.available | 2022-03-02T13:06:55Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 0957-4174 | |
dc.identifier.other | WOS:000732710500009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39226 | |
dc.source | WOS | |
dc.title | Dynamic few-view X-ray imaging for inspection of CAD-based objects | |
dc.type | Journal article | |
dc.contributor.imecauthor | Presenti, Alice | |
dc.contributor.imecauthor | Sijbers, Jan | |
dc.contributor.imecauthor | De Beenhouwer, Jan | |
dc.contributor.orcidimec | Presenti, Alice::0000-0001-7799-2237 | |
dc.contributor.orcidimec | De Beenhouwer, Jan::0000-0001-5253-1274 | |
dc.contributor.orcidimec | Sijbers, Jan::0000-0003-4225-2487 | |
dc.identifier.doi | 10.1016/j.eswa.2021.115012 | |
dc.source.numberofpages | 14 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 115012 | |
dc.source.journal | EXPERT SYSTEMS WITH APPLICATIONS | |
dc.source.issue | na | |
dc.source.volume | 180 | |
imec.availability | Published - open access | |