dc.contributor.author | Wu, Zhicheng | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Vandooren, Anne | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2022-03-02T13:47:15Z | |
dc.date.available | 2022-03-02T13:47:15Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.other | WOS:000612147300002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39231 | |
dc.source | WOS | |
dc.title | Effects of Back-Gate Bias on the Mobility and Reliability of Junction-Less FDSOI Transistors for 3-D Sequential Integration | |
dc.type | Journal article | |
dc.contributor.imecauthor | Wu, Zhicheng | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Vandooren, Anne | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Ben Kaczer::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.contributor.orcidimec | Vandooren, Anne::0000-0002-2412-0176 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.identifier.doi | 10.1109/TED.2020.3041813 | |
dc.source.numberofpages | 7 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 464 | |
dc.source.endpage | 470 | |
dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
dc.source.issue | 2 | |
dc.source.volume | 68 | |
imec.availability | Published - imec | |