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Reliability testing of InP HEMT's using electrical stress methods

dc.contributor.authorvan der Zanden, Koen
dc.contributor.authorSchreurs, Dominique
dc.contributor.authorMenozzi, R.
dc.contributor.authorBorgarino, M.
dc.date.accessioned2021-10-14T11:46:57Z
dc.date.available2021-10-14T11:46:57Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3923
dc.sourceIIOimport
dc.titleReliability testing of InP HEMT's using electrical stress methods
dc.typeJournal article
dc.contributor.imecauthorSchreurs, Dominique
dc.source.peerreviewno
dc.source.beginpage1570
dc.source.endpage1576
dc.source.journalIEEE Trans. Electron Devices
dc.source.issue8
dc.source.volume46
imec.availabilityPublished - imec


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