Cryogenic temperature DC-IV measurements and compact modeling of n-channel bulk FinFETs with 3-4 nm wide fins and 20 nm gate length for quantum computing applications
dc.contributor.author | Gupta, Sumreti | |
dc.contributor.author | Rathi, Aarti | |
dc.contributor.author | Parvais, Bertrand | |
dc.contributor.author | Dixit, Abhisek | |
dc.date.accessioned | 2022-03-03T13:19:02Z | |
dc.date.available | 2022-03-03T13:19:02Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 0038-1101 | |
dc.identifier.other | WOS:000709200800003 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39272 | |
dc.source | WOS | |
dc.title | Cryogenic temperature DC-IV measurements and compact modeling of n-channel bulk FinFETs with 3-4 nm wide fins and 20 nm gate length for quantum computing applications | |
dc.type | Journal article | |
dc.contributor.imecauthor | Parvais, Bertrand | |
dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
dc.identifier.doi | 10.1016/j.sse.2021.108089 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 108089 | |
dc.source.journal | SOLID-STATE ELECTRONICS | |
dc.source.issue | na | |
dc.source.volume | 185 | |
imec.availability | Published - imec |
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