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dc.contributor.authorGupta, Sumreti
dc.contributor.authorRathi, Aarti
dc.contributor.authorParvais, Bertrand
dc.contributor.authorDixit, Abhisek
dc.date.accessioned2022-03-03T13:19:02Z
dc.date.available2022-03-03T13:19:02Z
dc.date.issued2021
dc.identifier.issn0038-1101
dc.identifier.otherWOS:000709200800003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39272
dc.sourceWOS
dc.titleCryogenic temperature DC-IV measurements and compact modeling of n-channel bulk FinFETs with 3-4 nm wide fins and 20 nm gate length for quantum computing applications
dc.typeJournal article
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.identifier.doi10.1016/j.sse.2021.108089
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.beginpage108089
dc.source.journalSOLID-STATE ELECTRONICS
dc.source.issuena
dc.source.volume185
imec.availabilityPublished - imec


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