dc.contributor.author | Wu, Lizhou | |
dc.contributor.author | Rao, Siddharth | |
dc.contributor.author | Taouil, Mottaqiallah | |
dc.contributor.author | Medeiros, Guilherme Cardoso | |
dc.contributor.author | Fieback, Moritz | |
dc.contributor.author | Marinissen, Erik Jan | |
dc.contributor.author | Kar, Gouri Sankar | |
dc.contributor.author | Hamdioui, Said | |
dc.date.accessioned | 2022-03-03T14:23:17Z | |
dc.date.available | 2022-03-03T14:23:17Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 2168-6750 | |
dc.identifier.other | WOS:000658346300013 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39277 | |
dc.source | WOS | |
dc.title | Defect and Fault Modeling Framework for STT-MRAM Testing | |
dc.type | Journal article | |
dc.contributor.imecauthor | Rao, Siddharth | |
dc.contributor.imecauthor | Marinissen, Erik Jan | |
dc.contributor.imecauthor | Kar, Gouri Sankar | |
dc.contributor.orcidext | Taouil, Mottaqiallah::0000-0002-9911-4846 | |
dc.contributor.orcidext | Fieback, Moritz::0000-0002-9782-393X | |
dc.contributor.orcidext | Hamdioui, Said::0000-0002-8961-0387 | |
dc.contributor.orcidimec | Rao, Siddharth::0000-0001-6161-3052 | |
dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
dc.identifier.doi | 10.1109/TETC.2019.2960375 | |
dc.source.numberofpages | 17 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 707 | |
dc.source.endpage | 723 | |
dc.source.journal | IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING | |
dc.source.issue | 2 | |
dc.source.volume | 9 | |
imec.availability | Published - imec | |