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dc.contributor.authorAfzalian, Aryan
dc.date.accessioned2022-03-08T13:12:33Z
dc.date.available2022-03-08T13:12:33Z
dc.date.issued2021
dc.identifier.issn2397-7132
dc.identifier.otherWOS:000607110700005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39351
dc.sourceWOS
dc.titleAb initio perspective of ultra-scaled CMOS from 2D-material fundamentals to dynamically doped transistors
dc.typeJournal article
dc.contributor.imecauthorAfzalian, Aryan
dc.contributor.orcidimecAfzalian, Aryan::0000-0002-5260-0281
dc.identifier.doi10.1038/s41699-020-00181-1
dc.source.numberofpages13
dc.source.peerreviewyes
dc.source.beginpage5
dc.source.journalNPJ 2D MATERIALS AND APPLICATIONS
dc.source.issue1
dc.source.volume5
imec.availabilityPublished - open access


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