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Transistor modelling for mm-Wave technology pathfinding
dc.contributor.author | Parvais, B. | |
dc.contributor.author | ElKashlan, R. | |
dc.contributor.author | Yu, H. | |
dc.contributor.author | Sibaja-Hernandez, A. | |
dc.contributor.author | Vermeersch, B. | |
dc.contributor.author | Putcha, V | |
dc.contributor.author | Cardinael, P. | |
dc.contributor.author | Rodriguez, R. | |
dc.contributor.author | Khaled, A. | |
dc.contributor.author | Alian, A. | |
dc.contributor.author | Peralagu, U. | |
dc.contributor.author | Zhao, M. | |
dc.contributor.author | Yadav, S. | |
dc.contributor.author | Gramegna, G. | |
dc.contributor.author | Van Driessche, J. | |
dc.contributor.author | Collaert, N. | |
dc.date.accessioned | 2022-04-04T02:09:04Z | |
dc.date.available | 2022-04-04T02:09:04Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 1946-1569 | |
dc.identifier.other | WOS:000766985400058 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39572 | |
dc.source | WOS | |
dc.title | Transistor modelling for mm-Wave technology pathfinding | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Yu, H. | |
dc.contributor.imecauthor | Sibaja-Hernandez, A. | |
dc.contributor.imecauthor | Vermeersch, B. | |
dc.contributor.imecauthor | Cardinael, P. | |
dc.contributor.imecauthor | Rodriguez, R. | |
dc.contributor.imecauthor | Khaled, A. | |
dc.contributor.imecauthor | Alian, A. | |
dc.contributor.imecauthor | Peralagu, U. | |
dc.contributor.imecauthor | Zhao, M. | |
dc.contributor.imecauthor | Yadav, S. | |
dc.contributor.imecauthor | Gramegna, G. | |
dc.contributor.imecauthor | Van Driessche, J. | |
dc.contributor.imecauthor | Collaert, N. | |
dc.identifier.doi | 10.1109/SISPAD54002.2021.9592530 | |
dc.identifier.eisbn | 978-1-6654-0685-7 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 247 | |
dc.source.endpage | 250 | |
dc.source.conference | International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) | |
dc.source.conferencedate | SEP 27-29, 2021 | |
dc.source.conferencelocation | Dallas | |
imec.availability | Under review |
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