Notice

This item has not yet been validated by imec staff.

Notice

This is not the latest version of this item. The latest version can be found at: https://imec-publications.be/handle/20.500.12860/39619.2

Show simple item record

dc.contributor.authorde Beeck, Jonathan Op
dc.contributor.authorScheerder, Jeroen E.
dc.contributor.authorGeiser, Brian P.
dc.contributor.authorBunton, Joseph H.
dc.contributor.authorUlfig, Robert M.
dc.contributor.authorLarson, David J.
dc.contributor.authorvan der Heide, Paul
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorFleischmann, Claudia
dc.date.accessioned2022-04-14T02:09:42Z
dc.date.available2022-04-14T02:09:42Z
dc.date.issued2021-NOV 5
dc.identifier.issn1431-9276
dc.identifier.otherWOS:000776038000001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39619
dc.sourceWOS
dc.titleThe Prospect of Spatially Accurate Reconstructed Atom Probe Data Using Experimental Emitter Shapes
dc.typeJournal article
dc.contributor.imecauthorde Beeck, Jonathan Op
dc.contributor.imecauthorScheerder, Jeroen E.
dc.contributor.imecauthorvan der Heide, Paul
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.orcidimecvan der Heide, Paul::0000-0001-6292-0329
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.identifier.doi10.1017/S143192762101357X
dc.source.numberofpages9
dc.source.peerreviewyes
dc.source.journalMICROSCOPY AND MICROANALYSIS
imec.availabilityUnder review


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record

VersionItemDateSummary

*Selected version