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dc.contributor.authorSiller, Valerie
dc.contributor.authorZhu, Xinhua
dc.contributor.authorGehlhaar, Robert
dc.contributor.authorWojcik, Pawel J.
dc.contributor.authorMorata, Alex
dc.contributor.authorTarancon, Albert
dc.contributor.authorHubin, Annick
dc.date.accessioned2022-06-09T13:56:28Z
dc.date.available2022-04-18T02:09:31Z
dc.date.available2022-05-20T15:41:30Z
dc.date.available2022-06-09T13:56:28Z
dc.date.issued2022
dc.identifier.issn0013-4651
dc.identifier.otherWOS:000777812200001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39638.4
dc.sourceWOS
dc.titleSpectroscopic Ellipsometry for Operando Monitoring of (De)Lithiation-Induced Phenomena on LiMn2O4 and LiNi0.5Mn1.5O4 Electrodes
dc.typeJournal article
dc.contributor.imecauthorGehlhaar, Robert
dc.contributor.orcidimecGehlhaar, Robert::0000-0002-3038-9462
dc.identifier.doi10.1149/1945-7111/ac5ceb
dc.source.numberofpages11
dc.source.peerreviewyes
dc.source.beginpage040501
dc.source.journalJOURNAL OF THE ELECTROCHEMICAL SOCIETY
dc.source.issue4
dc.source.volume169
imec.availabilityPublished - open access
dc.description.wosFundingTextM. C. S gratefully acknowledges the support of the PhD fellowship (Grant No. 1SB6619N) from the Research Foundation Flanders (FWO). This project was partly founded by the European Union's Horizon 2020 research and innovation program under grant agreement No. 824072 (HARVESTORE). The authors thank Priya Laha for useful discussions and feedback on the ellipsometry set-up development, and Andrea Pitillas Martinez for her input on LNMO thin film preparation and characterization. The authors acknowledge Kurt J. Lesker Company on the collaboration on thin film deposition in the Mini SPECTROS and Nano 36 glovebox cluster tool.


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