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Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs
dc.contributor.author | Chang, Hao | |
dc.contributor.author | Zhang, Yongkui | |
dc.contributor.author | Zhou, Longda | |
dc.contributor.author | Ji, Zhigang | |
dc.contributor.author | Yang, Hong | |
dc.contributor.author | Liu, Qianqian | |
dc.contributor.author | Li, Yongliang | |
dc.contributor.author | Liang, Renrong | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Zhu, Huilong | |
dc.contributor.author | Luo, Jun | |
dc.contributor.author | Wang, Wenwu | |
dc.date.accessioned | 2022-04-28T02:12:57Z | |
dc.date.available | 2022-04-28T02:12:57Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 1946-1550 | |
dc.identifier.other | WOS:000782378200088 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39699 | |
dc.source | WOS | |
dc.title | Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.identifier.doi | 10.1109/IPFA53173.2021.9617433 | |
dc.identifier.eisbn | 978-1-6654-3988-6 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) | |
dc.source.conferencedate | SEP 14-OCT 13, 2021 | |
imec.availability | Under review |
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