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Non-Gaussian behavior and anticorrelations in ultrathin gate oxides after soft breakdown

dc.contributor.authorVandewalle, N.
dc.contributor.authorAusloos, M.
dc.contributor.authorHoussa, Michel
dc.contributor.authorMertens, Paul
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-14T11:51:35Z
dc.date.available2021-10-14T11:51:35Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3970
dc.sourceIIOimport
dc.titleNon-Gaussian behavior and anticorrelations in ultrathin gate oxides after soft breakdown
dc.typeJournal article
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorMertens, Paul
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.source.peerreviewno
dc.source.beginpage1579
dc.source.endpage1581
dc.source.journalAppl. Phys. Lett.
dc.source.issue11
dc.source.volume74
imec.availabilityPublished - imec


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