dc.contributor.author | Wu, Wei-Min | |
dc.contributor.author | Chen, Shih-Hung | |
dc.contributor.author | Putcha, Vamsi | |
dc.contributor.author | Peralagu, Uthayasankaran | |
dc.contributor.author | Sibaja-Hernandez, Arturo | |
dc.contributor.author | Yadav, Sachin | |
dc.contributor.author | Parvais, Bertrand | |
dc.contributor.author | Alian, AliReza | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Ker, Ming-Dou | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2023-01-19T12:50:59Z | |
dc.date.available | 2022-05-05T02:17:42Z | |
dc.date.available | 2023-01-19T12:50:59Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 0739-5159 | |
dc.identifier.other | WOS:000786179000003 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39754.2 | |
dc.source | WOS | |
dc.title | ESD Failures of GaN-on-Si D-Mode AlGaN/GaN MIS-HEMT and HEMT Devices for 5G Telecommunications | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Wu, Wei-Min | |
dc.contributor.imecauthor | Chen, Shih-Hung | |
dc.contributor.imecauthor | Putcha, Vamsi | |
dc.contributor.imecauthor | Peralagu, Uthayasankaran | |
dc.contributor.imecauthor | Sibaja-Hernandez, Arturo | |
dc.contributor.imecauthor | Yadav, Sachin | |
dc.contributor.imecauthor | Parvais, Bertrand | |
dc.contributor.imecauthor | Alian, AliReza | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Putcha, Vamsi::0000-0003-1907-5486 | |
dc.contributor.orcidimec | Peralagu, Uthayasankaran::0000-0001-9166-4408 | |
dc.contributor.orcidimec | Yadav, Sachin::0000-0003-4530-2603 | |
dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.contributor.orcidimec | Chen, Shih-Hung::0000-0002-6481-2951 | |
dc.contributor.orcidimec | Alian, AliReza::0000-0003-3463-416X | |
dc.identifier.doi | 10.23919/EOS/ESD52038.2021.9574716 | |
dc.identifier.eisbn | 978-1-58537-329-1 | |
dc.source.numberofpages | 7 | |
dc.source.peerreview | yes | |
dc.source.conference | 43rd Annual EOS/ESD Symposium (EOS/ESD) | |
dc.source.conferencedate | SEP 26-OCT 01, 2021 | |
dc.source.conferencelocation | Tucson | |
dc.source.journal | na | |
imec.availability | Published - imec | |