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ESD Failures of GaN-on-Si D-Mode AlGaN/GaN MIS-HEMT and HEMT Devices for 5G Telecommunications

dc.contributor.authorWu, Wei-Min
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorPutcha, Vamsi
dc.contributor.authorPeralagu, Uthayasankaran
dc.contributor.authorSibaja-Hernandez, Arturo
dc.contributor.authorYadav, Sachin
dc.contributor.authorParvais, Bertrand
dc.contributor.authorAlian, AliReza
dc.contributor.authorCollaert, Nadine
dc.contributor.authorKer, Ming-Dou
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2022-05-05T02:17:42Z
dc.date.available2022-05-05T02:17:42Z
dc.date.issued2021
dc.identifier.issn0739-5159
dc.identifier.otherWOS:000786179000003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39754
dc.sourceWOS
dc.titleESD Failures of GaN-on-Si D-Mode AlGaN/GaN MIS-HEMT and HEMT Devices for 5G Telecommunications
dc.typeProceedings paper
dc.contributor.imecauthorWu, Wei-Min
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorPutcha, Vamsi
dc.contributor.imecauthorPeralagu, Uthayasankaran
dc.contributor.imecauthorSibaja-Hernandez, Arturo
dc.contributor.imecauthorYadav, Sachin
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecPutcha, Vamsi::0000-0003-1907-5486
dc.contributor.orcidimecPeralagu, Uthayasankaran::0000-0001-9166-4408
dc.contributor.orcidimecYadav, Sachin::0000-0003-4530-2603
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecChen, Shih-Hung::0000-0002-6481-2951
dc.contributor.orcidimecAlian, AliReza::0000-0003-3463-416X
dc.identifier.eisbn978-1-58537-329-1
dc.source.numberofpages7
dc.source.peerreviewyes
dc.source.conference43rd Annual EOS/ESD Symposium (EOS/ESD)
dc.source.conferencedateSEP 26-OCT 01, 2021
dc.source.conferencelocationTucson
imec.availabilityUnder review


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220.500.12860/39754.22023-01-19T12:49:42Zvalidation by library/open access desk
120.500.12860/39754*2022-05-05T02:17:42Z

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