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Linking Room- and Low-Temperature Electrical Performance of MOS Gate Stacks for Cryogenic Applications
dc.contributor.author | Kao, K-H | |
dc.contributor.author | Godfrin, C. | |
dc.contributor.author | Elsayed, A. | |
dc.contributor.author | Li, R. | |
dc.contributor.author | Simoen, E. | |
dc.contributor.author | Grill, A. | |
dc.contributor.author | Kubicek, S. | |
dc.contributor.author | Radu, I. P. | |
dc.contributor.author | Govoreanu, B. | |
dc.date.accessioned | 2022-05-23T02:19:32Z | |
dc.date.available | 2022-05-23T02:19:32Z | |
dc.date.issued | 2022-MAY | |
dc.identifier.issn | 0741-3106 | |
dc.identifier.other | WOS:000794239500005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39884 | |
dc.source | WOS | |
dc.title | Linking Room- and Low-Temperature Electrical Performance of MOS Gate Stacks for Cryogenic Applications | |
dc.type | Journal article | |
dc.contributor.imecauthor | Godfrin, C. | |
dc.contributor.imecauthor | Elsayed, A. | |
dc.contributor.imecauthor | Li, R. | |
dc.contributor.imecauthor | Simoen, E. | |
dc.contributor.imecauthor | Grill, A. | |
dc.contributor.imecauthor | Kubicek, S. | |
dc.contributor.imecauthor | Radu, I. P. | |
dc.contributor.imecauthor | Govoreanu, B. | |
dc.identifier.doi | 10.1109/LED.2022.3162368 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 674 | |
dc.source.endpage | 677 | |
dc.source.journal | IEEE ELECTRON DEVICE LETTERS | |
dc.source.issue | 5 | |
dc.source.volume | 43 | |
imec.availability | Under review |
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