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Articles
Linking Room- and Low-Temperature Electrical Performance of MOS Gate Stacks for Cryogenic Applications
Publication:
Linking Room- and Low-Temperature Electrical Performance of MOS Gate Stacks for Cryogenic Applications
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Date
2022
Journal article
https://doi.org/10.1109/LED.2022.3162368
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838.73 KB
Published version
622.91 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kao, K-H
;
Godfrin, Clement
;
Elsayed, Asser
;
Li, Roy
;
Simoen, Eddy
;
Grill, Alexander
;
Kubicek, Stefan
;
Radu, Iuliana
;
Govoreanu, Bogdan
Journal
IEEE ELECTRON DEVICE LETTERS
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Downloads
497
since deposited on 2022-05-23
41
last month
12
last week
Acq. date: 2026-01-10
Views
1676
since deposited on 2022-05-23
2
last month
1
last week
Acq. date: 2026-01-10
Citations