Publication:

Linking Room- and Low-Temperature Electrical Performance of MOS Gate Stacks for Cryogenic Applications

Date

2022
Journal article
https://doi.org/10.1109/led.2022.3162368
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Accepted version 838.73 KB
Published version 622.91 KB

Author(s)

Kao, K-H
;
Godfrin, Clement  
;
Elsayed, Asser  
;
Li, Roy  
;
Simoen, Eddy  
;
Grill, Alexander  
;
Kubicek, Stefan  
;
Radu, Iuliana  
;
Govoreanu, Bogdan  

Journal

IEEE ELECTRON DEVICE LETTERS

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810 since deposited on 2022-05-23
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