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New method to correct for the influence of organic contamination on intensity ratios in quantitative XPS

dc.contributor.authorVereecke, Guy
dc.contributor.authorRouxhet, P. G.
dc.date.accessioned2021-10-14T11:53:46Z
dc.date.available2021-10-14T11:53:46Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3991
dc.sourceIIOimport
dc.titleNew method to correct for the influence of organic contamination on intensity ratios in quantitative XPS
dc.typeJournal article
dc.contributor.imecauthorVereecke, Guy
dc.contributor.orcidimecVereecke, Guy::0000-0001-9058-9338
dc.source.peerreviewno
dc.source.beginpage761
dc.source.endpage769
dc.source.journalSurface and Interface Analysis
dc.source.issue8
dc.source.volume27
imec.availabilityPublished - imec


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