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Bayesian Active Learning for Radiation Pattern Sampling Over Cylindrical Surfaces
dc.contributor.author | Garbuglia, Federico | |
dc.contributor.author | Claeys, Tim | |
dc.contributor.author | Couckuyt, Ivo | |
dc.contributor.author | Deschrijver, Dirk | |
dc.contributor.author | Dhaene, Tom | |
dc.date.accessioned | 2022-06-03T09:20:02Z | |
dc.date.available | 2022-06-03T02:21:06Z | |
dc.date.available | 2022-06-03T09:20:02Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 0018-9375 | |
dc.identifier.other | WOS:000799600400001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39921.2 | |
dc.source | WOS | |
dc.title | Bayesian Active Learning for Radiation Pattern Sampling Over Cylindrical Surfaces | |
dc.type | Journal article | |
dc.type | Journal article (pre-print) | |
dc.contributor.imecauthor | Garbuglia, Federico | |
dc.contributor.imecauthor | Couckuyt, Ivo | |
dc.contributor.imecauthor | Deschrijver, Dirk | |
dc.contributor.imecauthor | Dhaene, Tom | |
dc.contributor.orcidimec | Garbuglia, Federico::0000-0002-1917-1921 | |
dc.contributor.orcidimec | Couckuyt, Ivo::0000-0002-9524-4205 | |
dc.contributor.orcidimec | Deschrijver, Dirk::0000-0001-6600-1792 | |
dc.contributor.orcidimec | Dhaene, Tom::0000-0003-2899-4636 | |
dc.identifier.doi | 10.1109/TEMC.2022.3172483 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.source.journal | IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | |
dc.source.issue | / | |
dc.source.volume | 2022 | |
imec.availability | Under review |