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dc.contributor.authorBurr, Geoffrey W.
dc.contributor.authorLim, SukHwan
dc.contributor.authorMurmann, Boris
dc.contributor.authorVenkatesan, Rangharajan
dc.contributor.authorVerhelst, Marian
dc.date.accessioned2022-06-10T02:22:36Z
dc.date.available2022-06-10T02:22:36Z
dc.date.issued2022-JUN
dc.identifier.issn2168-2356
dc.identifier.otherWOS:000803107400007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39940
dc.sourceWOS
dc.titleFair and Comprehensive Benchmarking of Machine Learning Processing Chips
dc.typeEditorial material
dc.contributor.imecauthorVerhelst, Marian
dc.contributor.orcidimecVerhelst, Marian::0000-0003-3495-9263
dc.identifier.doi10.1109/MDAT.2021.3063366
dc.source.numberofpages10
dc.source.peerreviewyes
dc.source.beginpage18
dc.source.endpage27
dc.source.journalIEEE DESIGN & TEST
dc.source.issue3
dc.source.volume39
imec.availabilityUnder review


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