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dc.contributor.authorZborowski, C.
dc.contributor.authorVanleenhove, A.
dc.contributor.authorHoflijk, I.
dc.contributor.authorVaesen, I.
dc.contributor.authorArtyushkova, K.
dc.contributor.authorConard, T.
dc.date.accessioned2022-06-19T02:21:20Z
dc.date.available2022-06-19T02:21:20Z
dc.date.issued2022-JUN
dc.identifier.issn1055-5269
dc.identifier.otherWOS:000807715900001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39976
dc.sourceWOS
dc.titleHAXPES spectra of GaAs measured by Cr K-alpha
dc.typeJournal article
dc.contributor.imecauthorZborowski, C.
dc.contributor.imecauthorVanleenhove, A.
dc.contributor.imecauthorHoflijk, I.
dc.contributor.imecauthorVaesen, I.
dc.contributor.imecauthorConard, T.
dc.identifier.doi10.1116/6.0001527
dc.source.numberofpages11
dc.source.peerreviewyes
dc.source.journalSURFACE SCIENCE SPECTRA
dc.source.issue1
dc.source.volume29
imec.availabilityUnder review


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