Browsing Conference contributions by imec author "28f391f8c079b8b8f3c875abc8ff34f92a173436"
Now showing items 1-2 of 2
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Achieving reproducible data: examples from surface analysis in semiconductor technology
Conard, Thierry; van der Heide, Paul; Vanleenhove, Anja; Zborowski, Charlotte; Vandervorst, Wilfried (2019) -
Inelastic Background Analysis of Novel Laboratory-Based HAXPES Spectra
Zborowski, Charlotte; Conard, Thierry; Vanleenhove, Anja; van der Heide, Paul; Vandervorst, Wilfried; Flavell, Wendy; Spencer, Ben (2019)