Browsing Conference contributions by imec author "ac9fdea722352c1d5cd613a9113edc842a08cc57"
Now showing items 1-4 of 4
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Exploring the impact of confinement in Spreading Resistance Microscopy Analysis
Pandey, Komal; Paredis, Kristof; Vandervorst, Wilfried (2017) -
Mechanisms of high-pressure tip-induced material removal toward a tomographic AFM
Celano, Umberto; Pandey, Komal; Wouters, Lennaert; Paredis, Kristof; van der Heide, Paul; Vandervorst, Wilfried (2018) -
The impact of Focused Ion Beam (FIB) induced electrical damage on electrical characterization
Pandey, Komal; Paredis, Kristof; Drijbooms, Chris; Vandervorst, Wilfried; Bender, Hugo (2018) -
Understanding tip-induced nanoscale wear for tomographic atomic force microscopy
Celano, Umberto; Xiaoli, Hu; Pandey, Komal; Wouters, Lennaert; Paredis, Kristof; Hantschel, Thomas; van der Heide, Paul; Martini, Ashlie (2019)